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Ken van WykKen van Wyk

Ken van Wyk is a CERT® Certified Computer Security Incident Handler, an internationally recognized information security expert and author of two popular O'Reilly books, Incident Response: Planning & Management and Secure Coding: Principles and Practices, as well as a monthly columnist for eSecurityPlanet. Ken is a Visiting Scientist at the Software Engineering Institute at Carnegie Mellon University, where he is a course instructor and consultant to the CERT® Coordination Center.

Ken has previously held senior information security technologist roles at Tekmark's Technology Risk Management practice, Para-Protect Services, Inc., and Science Applications International Corporation (SAIC). Ken was also the Operations Chief for the U.S. Defense Information Systems Agency's DoD-CERT incident response team, as well as a founding employee of the CERT® Coordination Center at Carnegie Mellon University's Software Engineering Institute.

Ken has previously served as the Chairman and as a member of the Steering Committee for the Forum of Incident Response and Security Teams (FIRST), a non-profit professional organization supporting the incident response community. He currently sits on their Steering Committee and Board of Directors.


iPhone applications

Learning objectives

  • Gain insight into the risks faced by mobile applications, specifically iOS
  • Understand what security mechanisms are available to the iOS application developer
  • Understand what security testing can be feasibly achieved when developing iOS apps


This module explores the risks associated with mobile application security on Apple's iOS platform. It starts by building a common understanding of the risks themselves, and also provides an overview of the security mechanisms that are available to developers using Apple's Xcode software development kit. Lastly, mechanisms for testing iOS apps are discussed and demonstrated.


Solvay Brussels School of Economics and Management Katholieke Universiteit Leuven

Affiliated organizations:

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